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Dynamic Characteristics Measurement of Silicon Micro-cantilever in Low Temperature Environment

机译:低温环境下硅微悬臂梁的动态特性测量

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摘要

The dynamic testing system for MEMS in low temperature environment has been developed. A thermoelectric cooling refrigerator was utilized to generate the low temperature environment. The base excitation device was established using the piezoelectric ceramic as the driving source. A vacuum chamber was designed to protect the micro-structure from the humid air. Through the base impact excitation, the resonance frequencies are obtained by analyzing the impulse response signals. The frequency response of micro-cantilever was obtained by using both BIST method and laser Doppler vibrometer. The dynamic testing experiments for the silicon micro-cantilever were carried out from -50 ℃ to room temperature. The result shows that the resonance frequency slightly increases with the decreasing temperature. The measurement device is effective to carry out dynamic testing of microstructure from -50 ℃ to room temperature.
机译:开发了用于低温环境下的MEMS动态测试系统。利用热电冷却冰箱产生低温环境。使用压电陶瓷作为驱动源建立了基础激励装置。设计了一个真空室,以保护微结构不受潮湿空气的影响。通过基础冲击激发,通过分析脉冲响应信号来获得共振频率。通过使用BIST方法和激光多普勒振动计,获得了微悬臂梁的频率响应。在-50℃至室温下进行了硅微悬臂梁的动态测试实验。结果表明,共振频率随温度的降低而略有增加。该测量装置有效地进行了从-50℃到室温的微观组织动态测试。

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