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DC AND MICROWAVE CHARACTERISTICS OF HIGH TRANSCONDUCTANCE ALGAN/GAN HETEROSTRUCTURE FIELD EFFECT TRANSISTORS ON SIC SUBSTRATES

机译:Sic衬底上高导率Algan / GAN异质结场效应晶体管的直流和微波特性

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摘要

High quality AlGaN/GaN heterostructures have been successfully deposited on both n-and p-type SiC substrates. Heterostructure field effect transistors fabricated using these layers exhibited high channel current density (1.71 A/mm), well behaved pinch-off characteristics, and excellent extrinsic transconductance (G_m = 229 mS/mm). There is negligible channel current degradation up to a source to drAlN bias of 20 V as opposed to devices grown on sapphire substrates. The 0.25 urn gate-length devices fabricated on the heterostructures grown on p-type SiC has allowed us to extract a cutoff frequency of 53 GHz. The cutoff frequency showed little deterioration with increasing drAlN bias voltage. These results demonstrate for the first time the high frequency and high power operation potential of the heterostructure field effect transistors based on AlGaN grown on SiC.
机译:高质量的AlGaN / GaN异质结构已成功地沉积在n型和p型SiC衬底上。使用这些层制造的异质结构场效应晶体管表现出高沟道电流密度(1.71 A / mm),良好的夹断特性和出色的非本征跨导(G_m = 229 mS / mm)。与在蓝宝石衬底上生长的器件相反,直至20V的drAlN偏置源的沟道电流降级可以忽略不计。在p型SiC上生长的异质结构上制造的0.25 um栅长器件使我们能够提取53 GHz的截止频率。随着drAlN偏置电压的增加,截止频率几乎没有恶化。这些结果首次证明了在SiC上生长的基于AlGaN的异质结构场效应晶体管的高频和高功率工作潜力。

著录项

  • 来源
    《Nitride semiconductors》|1997年|1071-1075|共6页
  • 会议地点 Boston MA(US)
  • 作者单位

    APA Optics, Inc., 2950 NE 84~(th) Lane, BlAlNe, MN 55449;

    Current address: ECE Department, University of South Carolina, Columbia, SC 29208;

    Current address: ECE Department, University of South Carolina, Columbia, SC 29208;

    ECE Department, University of Illinois, Urbana, IL 61801;

    ECE Department, University of Illinois, Urbana, IL 61801;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 材料;
  • 关键词

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