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Detailed C-V analysis for YbMnO_3/Y_2O_3/Si structure

机译:YbMnO_3 / Y_2O_3 / Si结构的详细C-V分析

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摘要

YbMnO_3(Yb/Mn = 0.96) thin films were prepared on Y-2O_3(111)/Si(111). Although the sample exhibited ferroelectric type C-V hysteresis, the window width changed depending on the applied bias voltage. Hence, the ferroelectric type hysteresis might include the effect of space charge. To make clear the C-V behavior caused by only ferroelectricity, and to obtain the optimal relationship between ferroelectric and insulator layer thicknesses, the C-V behavior at high frequency was computed for MFIS structure. Relationships between the counter bias voltage applied to the ferroelectric layer and the thickness of dielectric layer were also demonstrated. Compared with the calculated results, experimental C-V characteristics are discussed.
机译:在Y-2O_3(111)/ Si(111)上制备YbMnO_3(Yb / Mn = 0.96)薄膜。尽管样品表现出铁电类型的C-V磁滞,但窗口宽度随施加的偏置电压而变化。因此,铁电类型的磁滞可能包括空间电荷的影响。为了弄清仅由铁电引起的C-V行为,并获得铁电和绝缘层厚度之间的最佳关系,针对MFIS结构计算了高频下的C-V行为。还证明了施加到铁电层的反偏压与电介质层的厚度之间的关系。与计算结果相比较,讨论了实验C-V特性。

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