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Optical Properties of InAs/lnP Planar Quantum Dot Microcavities

机译:InAs / lnP平面量子点微腔的光学性质

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Planar InAs/InP quantum dot microcavities using multi-layer SiO_2/Ta_2O_5 Bragg reflectors have been studied in emission. The spectra exhibit collection optics-limited cavity linewidths of ~1meV with the occasional ~200μeV single-dot emission. Measurements as a function of incident power show quantum dot saturation behavior, with transfer of oscillator strength to the wetting layer outside the cavity stop band. Saturation behavior at fixed pump power is also observed as a function of decreasing temperature. Dispersion measurements as a function of emission angle show polarization splitting in qualitative agreement with theory.
机译:在发射中研究了使用多层SiO_2 / Ta_2O_5布拉格反射器的平面InAs / InP量子点微腔。光谱显示出受光学限制的腔线宽为〜1meV,偶发点为〜200μeV。作为入射功率的函数的测量显示出量子点饱和行为,其中振荡器强度转移到腔阻带之外的润湿层。还观察到在固定泵功率下的饱和行为是温度降低的函数。色散测量值作为发射角的函数,表明偏振分裂与理论定性一致。

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