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High rate deposition of ta-C:H using an electron cyclotron wave resonance plasma source

机译:使用电子回旋波共振等离子体源高速率沉积ta-C:H

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摘要

A compact electron cyclotron wave resonance (ECWR) source has been developed for the high rate deposition of hydrogenated tetrahedral amorphous carbon (ta-C:H). The ECWR provides growth rates of up to 1.5 nm/s over a 4-inch diameter and an independent control of the deposition rate and ion energy. The ta-C:H was deposited using acetylene as the source gas and was characterized as having an sp~3 content of up to 77
机译:已经开发出紧凑的电子回旋波共振(ECWR)源,用于高速率沉积氢化四面体无定形碳(ta-C:H)。 ECWR在4英寸直径上提供高达1.5 nm / s的生长速率,并独立控制沉积速率和离子能量。使用乙炔作为原料气沉积ta-C:H,其sp〜3含量高达77

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