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TEM study of InAs self-assembled quantum dots in GaAs

机译:GaAs中InAs自组装量子点的TEM研究

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摘要

InAs self-assembled quantum dots grown on GaAs(001) substrate were investigated by TEM as well as by electrical transport measurements. The TEM analysis revealed the presence of a complicated triple-layer structure instead of simple dots for high In-concentrations. The electrical measurement suggest that the dots act as controllable scattering centers. A saturation of the mobility is observed for the highest dot density samples.
机译:通过TEM以及电迁移测量研究了在GaAs(001)衬底上生长的InAs自组装量子点。 TEM分析表明存在复杂的三层结构,而不是用于高In浓度的简单点。电学测量表明这些点充当可控制的散射中心。对于最高的点密度样品观察到迁移率的饱和。

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