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Development of real time/variable sensitivity warpage measurement technique and its application to plastic ball grid array package

机译:实时/可变灵敏度翘曲测量技术的发展及其在塑料球栅阵列封装中的应用

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摘要

Far infrared Fizeau interferometry (FIFI) and shadow moire with enhanced sensitivity (SMES) are developed for real time warpage measurement of microelectronics devices. The methods are implemented in a compact apparatus that is based on a computer controlled environmental chamber. The apparatus combines the two methods to provide unique capabilities of thermally induced warpage measurement with variable sensitivity, ranging from 5.3-100 /spl mu/m. The methods are employed to document warpage of plastic ball grid array packages subjected to various thermal cycles.
机译:开发了用于增强微电子器件实时翘曲测量的远红外菲索干涉法(FIFI)和具有增强灵敏度的阴影莫尔条纹(SMES)。该方法在基于计算机控制的环境室的紧凑设备中实现。该仪器结合了这两种方法,以提供独特的热致翘曲测量功能,其可变灵敏度范围为5.3-100 / spl mu / m。该方法用于记录经受各种热循环的塑料球栅阵列包装的翘曲。

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