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首页> 外文期刊>Japanese journal of applied physics >Entirely Crack-Free Ultraviolet GaN/AlGaN Laser Diodes Grown on 2-in. Sapphire Substrate
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Entirely Crack-Free Ultraviolet GaN/AlGaN Laser Diodes Grown on 2-in. Sapphire Substrate

机译:完全无裂纹的2英寸生长的GaN / AlGaN紫外激光二极管。蓝宝石基板

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摘要

We have succeeded in fabricating ultraviolet (UV) GaN/AlGaN laser diodes without any crack generation on a whole 2-in. sapphire substrate using a hetero-facet-controlled epitaxial lateral overgrowth (hetero-FACELO) method. The UV laser diodes lased in the peak wavelength range from 355.4 to 361.6 nm under a pulsed current operation at room temperature. We have also investigated both parameters, material gain and optical-internal loss in GaN/AlGaN multiple quantum wells (MQWs). The actual threshold currents of the UV laser diodes were practically in agreement with the estimated threshold current from these parameters. This layer structure is one of the solutions for the purpose of high-yield production of UV photonic devices.
机译:我们已经成功地制造了紫外线(UV)GaN / AlGaN激光二极管,整个2英寸制程中均未产生裂纹。蓝宝石衬底使用异面控制外延横向过度生长(hetero-FACELO)方法。在室温下以脉冲电流操作的峰值波长范围为355.4至361.6 nm的紫外激光二极管。我们还研究了GaN / AlGaN多量子阱(MQW)中的参数,材料增益和光学内部损耗。 UV激光二极管的实际阈值电流实际上与根据这些参数估算的阈值电流一致。这种层结构是用于高产量生产UV光子器件的解决方案之一。

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