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首页> 外文期刊>Journal of Crystal Growth >Electronic characteristics of InAs/GaAs self-assembled quantum dots by deep level transient spectroscopy
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Electronic characteristics of InAs/GaAs self-assembled quantum dots by deep level transient spectroscopy

机译:InAs / GaAs自组装量子点的深层瞬态光谱学电子特性

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摘要

A deep level transient spectroscopy technique has been used to determine the emission activation energies and capture barriers for electrons and holes in InAs self-assembled quantum dots embedded in GaAs. The ground electron and hole energies relative to their respective energy band edges of GaAs are 0.13 and 0.09 eV. Measurements show that the capture cross section of quantum dots is thermally activated. The capture barrier of quantum dots for electrons and holes are 0.30 and 0.26 eV, respectively. The results fit well with the results of photoluminescence spectroscopy measurements.
机译:深层瞬态光谱技术已被用于确定嵌入GaAs中的InAs自组装量子点中电子和空穴的发射活化能和俘获势垒。相对于GaAs的各自能带边缘的地电子和空穴能为0.13和0.09 eV。测量表明,量子点的捕获截面被热激活。电子和空穴的量子点的捕获势垒分别为0.30和0.26 eV。该结果与光致发光光谱测量的结果非常吻合。

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