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Atomic Force Microscopy (AFM) as a Powerful Tool to Study Temperature-Dependent Polymer Film Formation

机译:原子力显微镜(AFM)作为研究温度依赖性聚合物膜形成的有力工具

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摘要

Atomic force microscopy (AFM) is one of the most effective tools in nanotechnology researches. Using the raster scanning method with a soft cantilever, three dimensional sample surface topography can be obtained with a sub-nanometer resolution. In this study, AFM is employed to characterize the nanostructures of polymer film under two temperature treatments. 3-aminopropyltriethoxysilane (APTES) is selected as a model polymer molecule due to its wide applications for amino-f unctionalization of Si/SiOx based surfaces, such as silicon and mica. The APTES molecule has three ethoxy groups that can react with surface hydroxyl groups or with another APTES molecule through a siloxane bond. The self-assembled APTES self-assembly film has typically three configurations, namely uncrosslinked monolayer, crosslinked monolayer, and multilayer. Ten percent aqueous solution is used to cover the entire mica surfaces. Then the surfaces are rinsed with Dl water and dried with N_2 to remove left over solution. Two hours incubation was followed in 80℃C or 140℃, respectively. At 80℃ (below the boiling point), the uniform APTES film is obtained. On the other hand, at 140℃ (above the boiling point), the film exhibits multilayer structure, as confirmed by AFM images. Contact angle measurement shows that the multilayer film is less wettable than the monolayer film by 20°. It seems that the evaporation rate of the water layer on the substrate is the key to various film configurations.
机译:原子力显微镜(AFM)是纳米技术研究中最有效的工具之一。使用带有软悬臂的光栅扫描方法,可以获得亚纳米分辨率的三维样品表面形貌。在这项研究中,原子力显微镜被用来表征在两种温度处理下聚合物薄膜的纳米结构。选择3-氨基丙基三乙氧基硅烷(APTES)作为模型聚合物分子,是因为其广泛用于基于Si / SiOx的表面(如硅和云母)的氨基功能化。 APTES分子具有三个乙氧基,可通过硅氧烷键与表面羟基或与另一个APTES分子反应。自组装APTES自组装膜通常具有三种构造,即未交联的单层,交联的单层和多层。 10%的水溶液用于覆盖整个云母表面。然后将表面用去离子水冲洗并用N_2干燥以除去残留的溶液。在80℃或140℃下分别保温2小时。在80℃(低于沸点)下,获得均匀的APTES薄膜。另一方面,如通过AFM图像所证实的,在140℃(高于沸点),该膜表现出多层结构。接触角测量表明,多层膜的可湿性比单层膜低20°。看来基材上水层的蒸发速率是各种薄膜结构的关键。

著录项

  • 来源
    《Journal of Heat Transfer》 |2017年第2期|020904.1-020904.1|共1页
  • 作者

    Fei Long; Chang Kyoung Choi;

  • 作者单位

    Michigan Technological University, Houghton, Ml 49931;

    Michigan Technological University, Houghton, Ml 49931;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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