首页> 外文期刊>Journal of Non-Crystalline Solids: A Journal Devoted to Oxide, Halide, Chalcogenide and Metallic Glasses, Amorphous Semiconductors, Non-Crystalline Films, Glass-Ceramics and Glassy Composites >The role of ion-bulk interactions during high rate deposition of microcrystalline silicon by means of the multi-hole-cathode VHF plasma
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The role of ion-bulk interactions during high rate deposition of microcrystalline silicon by means of the multi-hole-cathode VHF plasma

机译:多孔阴极VHF等离子体在高速率沉积微晶硅过程中离子-本体相互作用的作用

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摘要

The high rate deposition of microcrystalline silicon (pc-Si:H) by means of the novel multi-hole-cathode very high frequency (MHC-VHF) plasma technique has been studied in the high-pressure depletion region (9.3 Torr). A distinct relationship between vacancy incorporation, the crystalline volume fraction and a qualitative measurement of the energy of the ions bombarding the substrate has been found. The observed relation is explained with the help of an ion-phase-diagram: we claim that the most energetic ions, containing at least one silicon atom, are responsible for the local amorphization of the mu c-Si:H films via the ion induced Si bulk displacement mechanism. (c) 2006 Elsevier B.V. All rights reserved.
机译:在高压耗尽区(9.3托)中,已经研究了通过新颖的多孔阴极超高频(MHC-VHF)等离子体技术进行的微晶硅(pc-Si:H)的高速率沉积。已经发现空位掺入,晶体体积分数和离子轰击基质的能量的定性测量之间存在明显的关系。观察到的关系借助离子相图进行了解释:我们声称,包含至少一个硅原子的最高能离子是通过诱导离子使mu c-Si:H薄膜局部非晶化的原因硅块体位移机制。 (c)2006 Elsevier B.V.保留所有权利。

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