首页> 外文期刊>Philosophical magazine, B. Physics of condensed matter, electronic, optical, and magnetic properties >Radiofrequency impedance measurements at 2 MHz on YBa2Cu3O7 epitaxial films
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Radiofrequency impedance measurements at 2 MHz on YBa2Cu3O7 epitaxial films

机译:YBa2Cu3O7外延膜在2 MHz下的射频阻抗测量

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Measurements of the temperature dependence of the rf electrical impedance of YBa2Cu3O7 epitaxial films of 0.25, 0.5 and 1.0 mum thickness are reported. The contactless 2 MHz ac measurements yield both the real and the imaginary parts of the impedance. The temperature dependence of the real part of the impedance shows a peak in the resistance just below T-c for all the sample thicknesses, and we interpret this as being due to a Kosterlitz-Thouless (K-T) transition. The imaginary part gives the change in the kinetic inductance. From an analysis of the data near the K-T transition temperature an effective superconducting thickness of the sample is determined. [References: 29]
机译:报道了厚度为0.25、0.5和1.0μm的YBa 2 Cu 3 O 7外延膜的rf电阻抗的温度依赖性的测量。非接触式2 MHz交流测量可产生阻抗的实部和虚部。阻抗实部的温度相关性在所有样品厚度中的T-c之下都显示出一个电阻峰值,我们认为这是由于Kosterlitz-Thouless(K-T)跃迁引起的。虚部给出了动感的变化。根据对K-T转变温度附近数据的分析,可以确定样品的有效超导厚度。 [参考:29]

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