首页> 外国专利> SILICON STRUCTURE WITH OPENING HAVING HIGH ASPECT RATIO, METHOD FOR MANUFACTURING THE SILICON STRUCTURE, APPARATUS FOR MANUFACTURING THE SILICON STRUCTURE, PROGRAM FOR MANUFACTURING THE SILICON STRUCTURE, AND METHOD FOR MANUFACTURING ETCHING MASK FOR THE SILICON STRUCTURE

SILICON STRUCTURE WITH OPENING HAVING HIGH ASPECT RATIO, METHOD FOR MANUFACTURING THE SILICON STRUCTURE, APPARATUS FOR MANUFACTURING THE SILICON STRUCTURE, PROGRAM FOR MANUFACTURING THE SILICON STRUCTURE, AND METHOD FOR MANUFACTURING ETCHING MASK FOR THE SILICON STRUCTURE

机译:具有高纵横比的开口的硅结构,硅结构的制造方法,硅结构的制造装置,硅结构的制造程序以及硅结构的蚀刻面的制造方法

摘要

[PROBLEMS] To provide a silicon structure with an opening having a high aspect ratio and an etching mask for forming the silicon structure. [MEANS FOR SOLVING PROBLEMS] In the manufacture of a silicon structure, the following steps are carried out. Silicon is subjected to hole etching or trench etching so that silicon at least on the bottom of an etched part is substantially exposed (hole etching or trench etching step). A silicon oxide film is formed by CVD on a silicon structure formed by the above hole etching or trench etching (silicon oxide film formation step). Thereafter, the formed silicon oxide film is exposed to hydrogen fluoride vapor-containing gas (gas exposure step). Further, the hole etching or trench etching step is again carried out. ® KIPO & WIPO 2009
机译:[问题]提供一种具有高纵横比的开口的硅结构和用于形成该硅结构的蚀刻掩模。 [解决问题的方法]在硅结构的制造中,执行以下步骤。对硅进行孔蚀刻或沟槽蚀刻,以使得至少在蚀刻部分的底部上的硅基本上暴露(孔蚀刻或沟槽蚀刻步骤)。通过CVD在通过上述孔蚀刻或沟槽蚀刻形成的硅结构上形成氧化硅膜(氧化硅膜形成步骤)。之后,将形成的氧化硅膜暴露于含氟化氢蒸气的气体(气体暴露步骤)。此外,再次进行空穴蚀刻或沟槽蚀刻步骤。 ®KIPO和WIPO 2009

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号