首页> 外国专利> Brief description of embodiments of the opening of small size, the use of this process for the manufacture of a field effect transistors, a grid aligned submicronic, and transistors thus obtained

Brief description of embodiments of the opening of small size, the use of this process for the manufacture of a field effect transistors, a grid aligned submicronic, and transistors thus obtained

机译:对小尺寸开口的实施例的简要说明,该工艺在制造场效应晶体管,栅极对准的亚微米器件以及由此获得的晶体管中的应用

摘要

Of opening of small size, the use of this process for the manufacture of a field effect transistors, a grid aligned submicronic, and transistors thus obtained. / p & & p & the invention relates to a method of embodiment of the opening of small size and the use of this process for the manufacture of a field effect transistors, a grid aligned submicron 7a, as well as the transistors obtained according to this / p & & p & a general manner, the invention consists in - be etched pattern has an intermediate, which disappears after use. / p & & p & the invention finds its application in the field of electronic more specifically in the manufacture of semi-finished - conductors.
机译:对于小尺寸的开口,使用该方法来制造场效应晶体管,栅极对准的亚微米电子以及由此获得的晶体管。 & &本发明涉及小尺寸开口的实施例的方法,并且该方法用于制造场效应晶体管,栅极对准的亚微米7a以及根据该方法获得的晶体管。 & &一般而言,本发明在于-被蚀刻的图案具有中间物,该中间物在使用后消失。 & &本发明发现其在电子领域的应用,更具体地讲,在半成品导体的制造中。

著录项

  • 公开/公告号FR2532471B1

    专利类型

  • 公开/公告日1984-12-07

    原文格式PDF

  • 申请/专利权人 LABO ELECTRONIQUE PHYSIQUE APPLI;

    申请/专利号FR19820014944

  • 发明设计人

    申请日1982-09-01

  • 分类号H01L21/312;H01L29/76;

  • 国家 FR

  • 入库时间 2022-08-22 07:56:01

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号