Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550 Japan;
Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550 Japan;
Department of Mechanical Sciences and Engineering, Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8550 Japan;
LINTEC Corporation, 5-14-42 Nishiki-cho, Warabi-shi, Saitama, 335-0005 Japan;
LINTEC Corporation, 5-14-42 Nishiki-cho, Warabi-shi, Saitama, 335-0005 Japan;
Adhesive; Peeling Test; Polymer Materials; Electronic Materials; Interface;
机译:胶带对IC芯片拾取过程中的剥离行为研究
机译:可靠的薄芯片从粘合带带有倒针喷射和弹簧缓冲
机译:合格胶带对薄芯片的可调剥离技术及机理
机译:IC芯片拾取性能与胶带剥离行为的相关性研究
机译:粘合微电子芯片的热结构行为。
机译:胶带剥离的粘滑动力学的时间标度
机译:通过新型计算梁相互作用模型研究粘合弹性纤维的剥离和剥离行为
机译:EpDm膜的胶带接缝性能:胶带粘合和液体粘合剂接缝的剥离蠕变 - 断裂响应的比较