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Refractive index profiling of the GRIN slab waveguides by phase measuring interferometry

机译：相位测量干涉法测量GRIN平板波导的折射率分布

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Abstract: A new method for determining the refractive index profile of GRIN waveguides has been proposed. It uses wedge samples whose preparation is a less time- consuming operation when compared to the known techniques, which use samples with plane parallel faces. !6

机译：摘要：提出了一种确定GRIN波导折射率分布的新方法。它使用楔形样品，与使用平面平行面的样品的已知技术相比，这种楔形样品的制备耗时较少。！6

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来源
《》|1992年|p.176-181|共6页
会议地点 Warsaw(PL)
作者
Malgorzata Sochacka; Univ. of Santiago de Compostela (Spain); Warszawa; Poland; Zbigniew Jaroszewicz; Univ. of Santiago de Compostela (Spain); Warszawa; Poland.;
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正文语种 eng
中图分类无线电电子学、电信技术;
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2. Determination of refractive index profiles of Ag~(+)-Na~(+) ion-exchange multimode strip waveguides by variable wavefront shear double-refracting interferometry microinterferometry [J] . Piotr Mrozek, Ewa Mrozek, Tadeusz Lukaszewicz Applied optics . 2006,第4期

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机译：具有双曲正割折射率分布的GRIN锥形平面波导在轴上和轴外对接耦合：数值孔径转换以及位置和角度转换
4. Refractive index profiling of the GRIN slab waveguides by phase measuring interferometry [C] . Malgorzata Sochacka, Zbigniew Jaroszewicz International donference on phase contrast and differential interference contrast imaging techniques and applications . 1994

机译：通过相位测量干涉测量法通过相位测量胶片折射率分析
5. Integrating optical techniques such as reflection, interferometry, scattering and fluorescence; bulk and surface acoustic waves; and microfluidics for measuring refractive index, viscosity, diffusion, surface tension, cell properties, and for sorting cells. [D] . Lapsley, Michael Ian. 2012

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6. Lapping and Polishing of Crystalline KY(WO4)2: Toward High Refractive Index Contrast Slab Waveguides [O] . Carlijn I. van Emmerik, Roy Kooijman, Meindert Dijkstra, 2019

机译：晶体KY（WO4）2的研磨和抛光：朝向高折射率对比平板波导
7. RETRACTED ARTICLE: Waveguide dispersion characteristics of graded/linearly chirp type’s refractive index profile of planar slab optical waveguide by using the modified finite element method [O] . Sanjeev Kumar Raghuwanshi, Santosh Kumar 2014

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8. Refracted-Ray Scanning (Refracted Near-Field Scanning) for Measuring Index Profiles of Optical Fibers [R] . Young, M. 1981

机译：折射光扫描（折射近场扫描）用于测量光纤的折射率分布

Refractive index profiling of the GRIN slab waveguides by phase measuring interferometry

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