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Study of Self-Healing 3D NAND Flash with Micro Heater to Improve the Performances and Lifetime for Fast NAND in NVDIMM Applications

机译:微加热器自愈3D闪光的研究改善了NVDIMM应用中快速NAND的性能和寿命

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A self-healing Flash with micro heater was proposed [1] to enable very high endurance (100M) for NAND Flash device by heating the device locally during P/E cycling stress. In this work, we propose to use the self-healing 3D NAND Flash with thermal assisted programming/erasing speed and much higher endurance to improve the performances of fast SLC NAND in NVDIMM applications. By applying an in-situly thermal heating of nearly 600C during programming and erasing we demonstrated the feasibility of sub-usec thermal assisted programming, and sub-10usec thermal assisted erasing with 100M endurance for SLC operation. The retention of self-healing 3D NAND Flash after 100M endurance still remains well, suggesting the good healing effect. System-level simulations indicate much reduced latency by the boosted PGM/ERS, while the greatly improved endurance greatly reduces the need for spare blocks for wear leveling (=lower cost) for NVDIMM applications.
机译:提出了一种具有微加热器的自愈式闪光灯,通过在P / E循环应力期间通过本地加热装置来实现NAND闪蒸装置的非常高的耐久性(100m)。在这项工作中,我们建议使用热疗3D NAND闪光,具有热辅助编程/擦除速度,更高的耐用性,以改善NVDIMM应用中快速SLC NAND的性能。通过在编程和擦除期间应用近600℃的高热加热,我们证明了Sub-Usec热辅助编程的可行性,并且Sub-10Usec热辅助擦除以100米的耐久性用于SLC操作。 100米耐久性后,保留自愈3D NAND闪光仍然良好,表明良好的愈合效果。系统级模拟表示增强的PGM / ERS的延迟大大降低,而大大提高的耐久性大大减少了对NVDIMM应用的佩戴型佩戴(=较低成本)的备用块的需求。

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