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首页> 外文会议>IEEE International Memory Workshop >Study of Self-Healing 3D NAND Flash with Micro Heater to Improve the Performances and Lifetime for Fast NAND in NVDIMM Applications
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Study of Self-Healing 3D NAND Flash with Micro Heater to Improve the Performances and Lifetime for Fast NAND in NVDIMM Applications

机译：研究带有微加热器的自愈式3D NAND闪存，以提高NVDIMM应用中快速NAND的性能和寿命

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摘要

A self-healing Flash with micro heater was proposed [1] to enable very high endurance (100M) for NAND Flash device by heating the device locally during P/E cycling stress. In this work, we propose to use the self-healing 3D NAND Flash with thermal assisted programming/erasing speed and much higher endurance to improve the performances of fast SLC NAND in NVDIMM applications. By applying an in-situly thermal heating of nearly 600C during programming and erasing we demonstrated the feasibility of sub-usec thermal assisted programming, and sub-10usec thermal assisted erasing with 100M endurance for SLC operation. The retention of self-healing 3D NAND Flash after 100M endurance still remains well, suggesting the good healing effect. System-level simulations indicate much reduced latency by the boosted PGM/ERS, while the greatly improved endurance greatly reduces the need for spare blocks for wear leveling (=lower cost) for NVDIMM applications.
机译：有人提出了一种带有微加热器的自愈式Flash [1]，通过在P / E循环应力期间局部加热NAND闪存设备来实现非常高的耐久性（100M）。在这项工作中，我们建议使用具有热辅助编程/擦除速度和更高耐久性的自修复3D NAND闪存，以提高NVDIMM应用中快速SLC NAND的性能。通过在编程和擦除过程中施加接近600°C的就地热加热，我们证明了亚用热辅助编程和具有100M耐力的10用亚热辅助擦除在SLC操作中的可行性。 100M续航后的自愈式3D NAND闪存仍保持良好状态，表明具有良好的修复效果。系统级仿真表明，增强的PGM / ERS大大降低了延迟，而耐用性大大提高，则大大减少了NVDIMM应用对备用块进行磨损均衡的需求（=降低了成本）。

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