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Impact of Mold Properties on the Reliability of Ball Grid Array Packaging

机译:模具性能对球栅阵列包装可靠性的影响

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A fatigue model based on viscoplastic material properties and accumulated plastic work was applied to predict crack initiation and crack propagation on Pb-free solder joints. The fatigue model relies on finite element analysis of Ball Grid array electronic packages and Design of Experiments methodology to explore the impact of mold material properties and thickness on the package reliability. It was observed that the outermost solder joint has the lowest failure free life in agreement with the literature.
机译:应用基于粘胶材料性能和积累塑性工作的疲劳模型来预测无铅焊点上的裂纹启动和裂纹繁殖。疲劳模型依赖于球网阵列电子封装的有限元分析和实验方法的设计,探讨模具材料性能和厚度对封装可靠性的影响。观察到最外面的焊点与文献一致的无故障生命。

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