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首页> 外文期刊>Journal of Crystal Growth >Metal-oxide-semiconductor devices with molecular beam epitaxy-grown Y_2O_3 on Ge
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Metal-oxide-semiconductor devices with molecular beam epitaxy-grown Y_2O_3 on Ge

机译:Ge上分子束外延生长的Y_2O_3金属氧化物半导体器件

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摘要

Excellent electrical performance has been achieved on Ge metal-oxide-semiconductor (MOS) devices using molecular beam epitaxy (MBE)-deposited dielectrics of Al_2O_3/Y_2O_3 directly on Ge(100) without utilizing any interfacial layers, such as GeO_xN_y or Si. Slight Ge diffusion into Y_2O_3 was observed using in-situ X-ray photoelectron spectroscopy. The interface between Y_2O_3 and Ge is atomically smooth after a high-temperature anneal at 500℃ for l0 min as characterized using high-resolution transmission electron microscopy. A high k value of Y_2O_3 of ~17.3 and a low gate leakage current density of 7.6 × 10~(- 9) A/cm~2 have been obtained from the MOS capacitors with a total capacitance equivalent thickness (CET) of 2.41 nm. Furthermore, ring-type p-channel MOS field-effect transistors with the same gate oxides have exhibited a high drain current density of 98 mA/mm, a peak transconductance of 43 mS/mm, and a hole mobility of 241 cm~2/V s with a gate length and a gate width of 4 and 400 urn, respectively.
机译:在使用分子束外延(MBE)沉积的Al_2O_3 / Y_2O_3直接在Ge(100)上的介电层的Ge金属氧化物半导体(MOS)器件上已实现了出色的电性能,而无需利用任何界面层,例如GeO_xN_y或Si。使用原位X射线光电子能谱观察到少量的Ge扩散到Y_2O_3中。 Y_2O_3与Ge之间的界面在500℃的高温退火10分钟后原子光滑,这是通过高分辨率透射电子显微镜进行表征的。从总电容等效厚度(CET)为2.41 nm的MOS电容器获得了高的Y_2O_3 k值〜17.3和低的栅极泄漏电流密度7.6×10〜(-9)A / cm〜2。此外,具有相同栅极氧化物的环形p沟道MOS场效应晶体管具有98 mA / mm的高漏极电流密度,43 mS / mm的峰值跨导和241 cm〜2 /的空穴迁移率。 V s的浇口长度和浇口宽度分别为4和400 urn。

著录项

  • 来源
    《Journal of Crystal Growth》 |2009年第7期|2195-2198|共4页
  • 作者单位

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Physics, National Tsing Hua University, Hsinchu 3001, Taiwan;

    Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 3001, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A3. Molecular beam epitaxy (MBE); B1. Oxides; B2. Germanium; B3. Field effects transistors;

    机译:A3。分子束外延(MBE);B1。氧化物;B2。锗;B3。场效应晶体管;

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