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Electrical properties of Individual single-crystalline gallium phosphide nanowires with an outer oxide shell

机译:具有外部氧化物壳的单个单晶磷化镓纳米线的电性能

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High-quality single-crystalline GaP nanowires were grown by a simple vapour deposition method and their electrical and opto-electric transport properties were studied. Structural studies showed that the GaP nanowires consisted of a core-shell structure with a single-crystalline GaP core and an outer gallium oxide (GaO_x) layer of thickness approx 6 nm. The individual GaP nanowires exhibited n-type field effects with an on/off ratio as high as 10~5 and their carrier mobilities are in the range of about 10-22 cm~2 V~(-1) s~(-1) at room temperature. When the devices were exposed to an ultraviolet (UV) light source, the current in the nanowires increased abruptly to more than 10~3 times, and this was possibly due to carrier generation in the nanowires and de-adsorption of adsorbed O_2~- ions on the GaO_x surface shell. The nanowires also showed good reversible switching actions between the high- and low-resistance states.
机译:通过简单的气相沉积方法生长了高质量的单晶GaP纳米线,并研究了它们的电和光电传输特性。结构研究表明,GaP纳米线由具有单晶GaP核的核-壳结构和厚度约为6 nm的外氧化镓(GaO_x)层组成。单个GaP纳米线表现出n型场效应,其开/关比高达10〜5,其载流子迁移率在约10-22 cm〜2 V〜(-1)s〜(-1)范围内。在室温下。当设备暴露于紫外线(UV)光源下时,纳米线中的电流突然增加到10到3倍以上,这可能是由于纳米线中载流子的产生和吸附的O_2-离子的解吸附在GaO_x表面外壳上。纳米线还显示出在高电阻状态和低电阻状态之间良好的可逆切换动作。

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