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首页> 美国政府科技报告 >Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy
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Synchrotron radiation induced x-ray micro analysis: A realistic alternative for electron- and ion beam microscopy

机译：同步辐射诱导的X射线微观分析：电子和离子束显微镜的现实替代方案

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Synchrotron Radiation induced X-ray micro Fluorescence analysis ((mu)-SRXRF) is compared with more conventional microanalytical techniques such as Secondary Ion Microscopy (SIMS) and Electron Probe X-ray Microanalysis (EPXMA) for two typical microanalytical applications. SRXRF and EPXMA are employed for the analysis of individual particles, showing the complementary character of both techniques. By means of element mapping of trace constituents in a heterogeneous feldspar, the strong and weak points of SRXRF in comparison to EPXMA and SIMS are illustrated. The most striking difference between SRXRF and the other two microanalytical methods is the ability of SRXRF to probe deep into the investigated Material, whereas SIMS and EPXMA only investigate the upper surface of the material. The possibilities of SRXRF at third generation synchrotron rings is also briefly discussed.

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