首页> 外国专利> Process for epitaxially growing a gallium arsenide layer having reduced silicon contaminants on a gallium arsenide substrate

Process for epitaxially growing a gallium arsenide layer having reduced silicon contaminants on a gallium arsenide substrate

机译:在砷化镓衬底上外延生长具有减少的硅污染物的砷化镓层的方法

摘要

A process for epitaxially forming a layer of gallium arsenide having a first conductivity on a substrate of gallium arsenide having a second conductivity in an enclosure having an inner liner comprised of a silicon compound, comprising decomposing arsine to form arsenic; chemically reacting a first quantity of hydrogen chloride and gallium to form gallium chloride, the gallium chloride reacting with the arsenic to form gallium arsenide on the substrate, a portion of the first quantity of hydrogen chloride remaining unreacted and tending to cause silicon contaminants from the liner to be deposited on the substrate; and providing a second quantity of hydrogen chloride into the enclosure which serves to initially etch, and hence clean, the outer surface of the substrate prior to the formation of gallium arsenide thereon, and simultaneously tends to inhibit the formation of silicon contaminants on the substrate, the second quantity and the first quantity having a preselected ratio such that the growth rate of the gallium arsenide layer on the substrate is greater than the etching rate of gallium arsenide due to the second quantity of hydrogen.
机译:在具有第二导电性的砷化镓镓的衬底上外延形成具有第二导电性的砷化镓层的方法,该外壳具有由硅化合物构成的内衬层,该方法包括分解a以形成砷。第一部分氯化氢和镓化学反应形成氯化镓,氯化镓与砷反应在基板上形成砷化镓,第一部分氯化氢的一部分未反应并趋于从衬里引起硅污染物沉积在基板上;向外壳中提供第二量的氯化氢,用于在其上形成砷化镓之前首先蚀刻并清洁衬底的外表面,同时趋于抑制在衬底上形成硅污染物,第二数量和第一数量具有预先选择的比率,使得由于第二数量的氢,衬底上的砷化镓层的生长速率大于砷化镓的蚀刻速率。

著录项

  • 公开/公告号US4155784A

    专利类型

  • 公开/公告日1979-05-22

    原文格式PDF

  • 申请/专利权人 TRW INC;

    申请/专利号US19770785881

  • 申请日1977-04-08

  • 分类号H01L21/205;H01L21/465;H01L29/20;

  • 国家 US

  • 入库时间 2022-08-22 19:17:52

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