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首页> 外文会议>Symposium on Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures Dec 2-6, 2002 Boston, Massachusetts, U.S.A. >Chemical Force Microscopic Study of UV Excimer Laser Irradiated Polyamide
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Chemical Force Microscopic Study of UV Excimer Laser Irradiated Polyamide

机译：准分子激光辐照聚酰胺的化学力显微镜研究

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摘要

Recently, there has been great interest in physico-chemical treatment for modifying polymer surfaces. UV Excimer laser irradiation is of particular interest in morphological and chemical modifications. Depending on the laser energies used, effects of laser treatment fall into two groups: above the ablation threshold the ripple structures of micrometer size form (high-fluence), and below the ablation threshold the sub-micron structures emerge (low-fluence). Traditional methods of studying chemical properties are Fourier-transform infrared spectroscopy, x-ray photoelectron spectroscopy, and mass spectroscopy. The ability of a relatively new technique involving chemical force microscopy (CFM) can be used to image and discriminate the areas exposing different functional groups on polymers. Gold-coated AFM tip modified with carboxylic acid (-COOH) terminated self-assembled alkanethiol monolayers (SAMs) was used to measure the adhesive forces between the tip and the laser treated samples in a water or hexane medium. The CFM results showed that high-fluence laser treated polyamide has the highest adhesive force with the modified tip in a water medium when compared with the control and low-fluence ones. The adhesive force is due to electrostatic attraction between the negatively charged tips terminating in COO~- groups and the positively charged sample terminating in NH~+ groups. This indicates that the high-fluence laser treated sample results in the formation of many amine end-groups on the polymer surface. In comparison, only low-fluence treated surface shows adhesive force with the modified tip in a hexane medium. This implies that the low-fluence laser treated polyamide has substantially more hydrophilic groups than the untreated and high-fluence laser treated samples. The adhesion force measurements by CFM allow one to have better understanding of surface chemical modifications induced by UV excimer laser.
机译：最近，人们对用于修饰聚合物表面的物理化学处理非常感兴趣。 UV准分子激光辐射在形态和化学修饰方面特别受关注。根据所使用的激光能量，激光处理的效果可分为两类：在烧蚀阈值之上，微米级尺寸的波纹结构（高通量）；在烧蚀阈值之下，出现亚微米结构（低通量）。研究化学性质的传统方法是傅立叶变换红外光谱，X射线光电子能谱和质谱。涉及化学力显微镜（CFM）的较新技术的功能可用于成像和区分暴露聚合物上不同官能团的区域。用羧酸（-COOH）端接的自组装烷硫醇单层（SAMs）修饰的金涂层AFM吸头用于测量吸头与激光或水或己烷介质中经激光处理的样品之间的粘合力。 CFM结果表明，与对照和低通量的聚酰胺相比，高通量激光处理的聚酰胺在水介质中对改性针尖的粘合力最高。粘附力是由于终止于COO〜-基团的带负电荷的尖端与终止于NH〜+基团的带正电荷的样品之间的静电吸引。这表明经高通量激光处理的样品导致在聚合物表面形成许多胺端基。相比之下，只有低通量处理的表面在己烷介质中显示出与改性针尖的粘附力。这意味着低通量激光处理的聚酰胺比未处理和高通量激光处理的样品具有更多的亲水基团。通过CFM测量粘附力，可以更好地了解由紫外线准分子激光引起的表面化学改性。

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