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Characterization of low temperature synthesized hexagonal diamond thin films

机译:低温合成六角形金刚石薄膜的表征

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摘要

Characterization of hexagonal diamond thin films synthesized by photo-enhanced chemical vapor deposition method at 450 A degrees C on Al/Ni coated thermally oxidized Si wafer substrates is reported here. Measurements of optical, electrical and mechanical properties of synthesized hexagonal diamond films are reported for the first time. Optical band gap of the hexagonal diamond film is approximately 1.0 eV as obtained from the Tauc plot utilizing UV-Visible spectroscopy. Nanoindenter is utilized for I-V and reduced modulus measurements on the hexagonal diamond films.
机译:在此报道了通过光增强化学气相沉积法在450°C下在Al / Ni涂层的热氧化Si晶片基板上合成的六角形金刚石薄膜的特性。首次报道了合成六角形金刚石薄膜的光学,电气和机械性能的测量。六边形金刚石膜的光学带隙约为1.0 eV,这是根据Tauc图利用紫外线可见光谱获得的。 Nanoindenter用于六边形金刚石薄膜的I-V和降低模量的测量。

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