首页> 外文会议>Symposium on Multicomponent Oxide Films for Electronics held April 6-8,1999,San francisco,California,U.S.A. >Epitaxial growth of Yb_2O_3 buffer layers on biaxially textured-Ni(100) substrates by sol-gel process
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Epitaxial growth of Yb_2O_3 buffer layers on biaxially textured-Ni(100) substrates by sol-gel process

机译:溶胶凝胶法在双轴织构Ni(100)衬底上外延生长Yb_2O_3缓冲层

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摘要

In order to develop an alternative buffer layer architecture using the sol-gel process to produce YBCO (YBa_2Cu_3O_7- delta ) coated conductors, Yb_2O_3 has been chosen as the candidate materials. Buffer layers of Yb_2O_3 were epitaxially grown on biaxially textured-Ni (100) substrates by the sol gel process for the first time. The Yb_2O_3 precursor solution was prepared from an alkoxide sol-gel route in 2-methoxyethanol and was deposited on textured-Ni(100) substrates by either spin coating or dip coating methods. The amorphous film was then processed at 1160 deg C unde rflowifng (96
机译:为了开发使用溶胶-凝胶工艺生产YBCO(YBa_2Cu_3O_7-delta)涂层导体的替代缓冲层架构,已选择Yb_2O_3作为候选材料。 Yb_2O_3的缓冲层是通过溶胶凝胶工艺首次在双轴织构Ni(100)衬底上外延生长的。 Yb_2O_3前体溶液是通过在2-甲氧基乙醇中的醇盐溶胶-凝胶路线制备的,并通过旋涂或浸涂方法沉积在织构化的Ni(100)衬底上。然后将非晶膜在1160摄氏度的温度下进行流化处理(96

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