Si-COE, School of EEE, Nanyang Technological University, Singapore;
Si-COE, School of EEE, Nanyang Technological University, Singapore;
Temasek Lab@NTU, Nanyang Technological University, Singapore;
Temasek Lab@NTU, Nanyang Technological University, Singapore;
Temasek Lab@NTU, Nanyang Technological University, Singapore;
HEMTs; MODFETs; Aluminum gallium nitride; Wide band gap semiconductors; Radio frequency; Substrates; Density measurement;
机译:GaN沟道层厚度对复合AlGaN / GaN缓冲层GaN HEMT的DC和RF性能的影响
机译:直流功耗小的AlGaN-GaN HEMT的微波噪声性能
机译:分析DC,通道温度和原位SIN / Algan-Sandwich-Barrier / GaN /Al₀.₀₅Ghmts的rf性能
机译:高功率CW操作中的CVD-金刚石上的AlGaN / GaN Hemts的增强直流和RF性能
机译:机械应力对AlGaN / GaN HEMT性能的影响:沟道电阻和栅极电流。
机译:基于PD-Algan / GaN HEMTS栅极偏压调制的二氧化氮气体传感器性能优化
机译:CVD-钻石中Algan / GaN Hemts中直流和RF性能的自热效应研究